Bay Carbon's CVP Process
1. High purity - 20 ppm or less *
2. CVP purity - 5 ppm or less (No more than 2 elements may be present. No single element may exceed 1 ppm) *
3. Semiconductor purity - 0.05 ppm or less. **
* Purity testing is performed on an ATOMCOMP 2000 Dual Slit High Resolution DC Arc Spectrometer using a cathode-enriched layer excited by 12.1 amps. D.C. current. The CID (charge injection Device) detector is a single solid-state chip with over 250,000 light-sensitive detector elements (pixels), providing continuous wavelength coverage from 190 to 800 nm. In this method a stallwood jet is used. This apparatus surrounds the electrode with inert gas in order to stabilize the arc and to reduce CN (cyanogens) banding.
**Glow-Discharge Mass Spectrometry (GDMS). Full periodic table coverage (except H) Allow 7 - 10 business days for testing results.1. 15" dia. x 38" long. 3.89 cu ft
2. 16" dia. x 50" long. 5.82 cu ft
3. 30" dia. x 45" long. 18.41 cu ft
4. 30" dia. x 59" long. 24.13 cu ft
5. 40" dia. x 68" long. 49.45 cu ft
6. 40" dia. x 84" long. 61.09 cu ft
7. 64" x 34" x 67" long. 84.37 cu ft
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specific size of graphite.